X-ray Mapping and Chemical Phase Mapping with an Amptek SDD
نویسندگان
چکیده
X-ray mapping (XRM) is the collection of characteristic x-rays as a function of the position of the scanning electron beam on the specimen. This analytical technique provides a high magnification image related to the distribution and relative abundance of elements within a given specimen. Consequently, XRM has become one of the most popular and useful methods of microanalysis and has been widely implemented in many areas of research including materials science, biology, geology and environmental science.
منابع مشابه
XRF-FP is a full-featured quantitative analysis package for XRF
AMPTEK INC. 14 DeAngelo Drive, Bedford, MA 01730-2204 U.S.A. APPLICATIONS • X-Ray Fluorescence • Thin-film Analysis • RoHS/WEEE Analysis • Teaching and Research • Art and Archaeology • Process Control • X-ray Tube Characterization FEATURES • Fundamental parameters (FP) • Analysis with or without standards • General bulk and thin-film analysis • Analyze up to 40 elements • Supports all Amptek de...
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